SAN FRANCISCO, Dec. 16, 2013 /PRNewswire/ -- UBM Tech's portfolio of communities for the electronics industry today announced the finalists for the EDN 2014 Best in Test Awards competition. The awards recognize the best in test products and test professionals and are comprised of three main categories - the Best in Test Product Awards, the Test Product of the Year Award and the Test Engineer of the Year Award. The EDN.com community is asked to vote online for the award winners at http://ow.ly/rOon3 through December 31, 2013. Winners will be announced during The Best in Test 2014 Awards ceremony on January 29, 2014 in Santa Clara, CA, held in conjunction with DesignCon 2014.
"The Best in Test Awards has celebrated the best innovations and innovators in the electronics test industry for more than two decades," said Martin Rowe, Senior Technical Editor, EDN's Test & Measurement Design Center and EE Times' Test & Measurement Designline, UBM Tech. "Every year the field of nominations grows stronger, raising the bar higher for the following year, and this year is no exception. It is a reflection on the state of the industry, the creativity and ingenuity with which key test products address problems and offer solutions. This year's finalists are an excellent example."
The Best in Test Product Awards honor important and innovative new products and services in the electronics test and measurement industry. Products from all areas of electronics testing and inspection are eligible. The Test Product of the Year Award is an overall winner of the Best in Test Product winners. The Test Engineer of the Year Award pays tribute to the important contributions test engineers make to the quality of electronics components, products and systems. The award winner receives a $10,000 educational grant, courtesy of sponsor National Instruments, which is presented to an engineering school designated by the winner.
The Best in Test finalists include:
-- Manufacturing Test / ATE -- M9703A AXIe Eight-Channel Wideband Digital Receiver/Digitizer, Agilent Technologies -- RF Device PXI Test Solution, Agilent Technologies -- ScanWorks Intel SiliconView Technology, ASSET InterTech -- compactUTS Functional Test Platform, Bloomy Controls -- SFX-TAP16/G-RM TAP Transceiver, Goepel Electronic -- J750Ex-HD Production Test System, Teradyne
-- Data Acquisition -- USB-2405 4-CH 24-Bit Dynamic Signal Acquisition Module, ADLink Technology -- U5303A PCIe 12-bit High-Speed Digitizer with Custom On-Board Processing, Agilent technologies -- BTH-1208LS Wireless Multifunction DAQ Device with Android and Windows Support, Measurement Computing -- NI cDAQ-9188XT CompactDAQ Rugged 8-Slot Ethernet Chassis, National Instruments -- Relio R3 Solid-State Rackmount Computer, Sealevel Systems
-- Handheld / Portable Test -- FlexTester3 Handheld ODTR, AFL Global -- FieldFox Remote Control Capability, Agilent Technologies -- Wire Integrity Tester (WIT), Astronics DME -- Versiv Cable Certification Testers, Fluke Networks -- PicoScope 5000 Series Oscilloscopes, Pico Technology
-- Machine Vision / Inspection -- OptiCon THT-Line Automated Inspection Systems, Goepel Electronic -- MV-9 2D/3D CoaXPress In-Line AOI Series, MIRTEC -- V810 XXL AXI, 3D In-Line Advanced X-Ray Inspection System, ViTrox
-- Network Test (Wired, Wireless, Hybrid, Optical) -- MT9083 Fiber Visualizer, Anritsu -- Intelligent Over-the-Air (iOTA) Platform, Azimuth Systems -- OptiView XG Network Analysis Tablet, Fluke Networks -- TestShell 5.0 Automation Software Platform for Lab Infrastructure, QualiSystems -- Avalanche NEXT Application and Security Test Software, Spirent Communications -- Spectra2 XL3 Core Network Test Software, Tektronix Communications
-- Test Support: Programmable Power Supplies, Signal Generators, Etc. -- N7900 Series Advanced Power System Dynamic DC Power Supplies, Agilent Technologies -- 2450 SourceMeter Source Measure Unit (SMU), Keithley Instruments -- MTS-916-3, Modular Target Simulator, TV/CCD & IR, Marvin Test Solutions -- NI PXIe-8383mc MultiComputing Module, National Instruments -- RTM2000 Digital Oscilloscope, Rohde & Schwarz -- PA4000 Power Analyzer, Tektronix
-- RF / Microwave Test -- PXI Maestro Test System, Aeroflex -- X-Series Signal Analyzers with Real-Time Spectrum Analysis, Agilent Technologies -- VectorStar MS4640B Vector Network Analyzer, Anritsu -- ESR EMI Test Receiver, Rohde & Schwarz -- SMW200A Vector Signal Generator, Rohde & Schwarz -- AWG70000 Arbitrary Waveform Generator, Tektronix -- RSA5000 Real-time Spectrum Analyzer, Tektronix
-- Semiconductor Test -- CM300 Probe System, Cascade Microtech -- Nighthawk RF Connectivity IC Tester, LTX-Credence -- DFTMAX Ultra Compression Architecture, Synopsys -- DesignWare STAR Hierarchical System, Synopsys
-- Signal Integrity / High-Speed Test -- MP1800A Signal Quality Analyzer, Anritsu -- PicoScope 9312 20 GHz sampling scope with 40 ps differential TDR/TDT, Pico Technology -- NI PXIe-5162 Digitizer, National Instruments -- MSO/DPO70000DX Series Performance Oscilloscopes, Tektronix
-- Software / Embedded Test -- x1149 Boundary Scan Analyzer, Agilent Technologies -- ScanWorks Arium Real-Time Instruction Trace (RTIT) Debugger for Intel Silvermont, ASSET InterTech -- ChipVORX for Bit Error Rate Tests, Goepel Electronic -- ATEasy Test Executive and Development Studio 9.0, Marvin Test Solutions -- Tessent Hybrid TestKompress/LogicBIST Solution, Mentor Graphics -- Manchester and NRZ Configurable Decode, Teledyne LeCroy
-- The Test Engineer of the Year finalists include: -- Dr. Karl Bois, Master Engineer/Signal Integrity Technical Leader, Hewlett-Packard -- Dr. Daniel Chow, Principal Signal Integrity Engineer, Apple -- Peter J. Pupalaikis, Vice President, Technology Development, Teledyne LeCroy and Roger Delbue, Vice President, Engineering, Teledyne LeCroy -- Steve Sandler, Chief Power Supply Test Engineer, Picotest
To vote on the award finalists, visit: http://ow.ly/rOon3
EDN is an online community designed for electronics design engineers, developers, and industry-related management. EDN provides engineers with the technology trends and design-how-to information they need to keep pace in this fast-paced environment, as well as the networking, contacts, mentoring, and peer-to-peer knowledge opportunities needed to take an idea from concept to reality.
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