CLEVELAND -- (BUSINESS WIRE) -- Keithley Instruments, a world leader in advanced electrical test instruments and systems, is offering a free, web-based seminar titled “Optimizing Semiconductor Measurements and Test Times.” This event, which is available for on-demand viewing, discusses how test engineers can meet the challenge of maximizing throughput without sacrificing accuracy in the testing of semiconductor devices. It also provides insight into the high current and high voltage requirements of today's power semiconductor devices. To register for this web-based seminar, visit http://www.keithley.com/promo/ws/1403.
“Optimizing Semiconductor Measurements and Test Times” offers valuable information to engineers involved in the characterization and testing of semiconductor devices and materials. Topics discussed include:
About the Presenter
Jennifer Cheney is a staff applications engineer at Keithley Instruments. She earned a B.S. in electrical engineering from Case Western Reserve University in Cleveland, OH. She has been assisting customers with instrument applications since 2001.
For More Information
To register for on-demand viewing of this webinar, please visit http://www.keithley.com/promo/ws/1403. To learn more about Keithley, please contact the company at:
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About Keithley Instruments
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio.